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    Talks 1-20 21-40 41-60 61-80 81-100 101-126

     

    1. L.Vanzetti, M.Bersani, M.Sbetti and M.Anderle; “XPS and SIMS depth profiling of oxynitrides”; 8th European Conference on Applications of Surface and Interface Analysis – ECASIA ’99; Sevilla (Spain), 4th-8th October 1999.

    2. M.Anderle, R.Canteri, E.Carli, S.Janikowska, A.Lui, C.Pederzolli, G.Speranza, D.Maniglio, C.Della Volpe; “Microbial adhesion on polymer: Role of morphological and chemical properties in the micro-organism behaviour”; 47th International Symposium: Vacuum, thin films, surfaces/interfaces and processing, Boston (USA), October 2-6, 2000.

    3. N.Laidani, G.Speranza, L.Calliari, V.Micheli and M.Anderle; “Chemical and microstructural characterization of silicon-containing carbon films”; E-MRS-Spring Meeting 2001, Symposium C, Strasbourg June 5-8, 2001

    4. C.Della Volpe, S.Siboni, D.Maniglio, M.Morra, C.Cassinelli, M.Anderle, G.Speranza, R.Canteri, C.Pederzolli, G.Gottardi, S.Janikowska; “Recent theoretical advancements in the application of Good-van Oss acid-base theory to the analysis of polymer surfaces. (I) General”; 3rd International Symposium on acid-base interactions: relevance to the adhesion, Newark, June 13-15, 2001.

    5. C.Della Volpe, S.Siboni, D.Maniglio, M.Morra, C.Cassinelli, M.Anderle, G.Speranza, R.Canteri, C.Pederzolli, G.Gottardi, S.Janikowska; “Recent theoretical advancements in the application of Good-van Oss acid-base theory to the analysis of polymer surfaces. (II) Some peculiar cases.”; 3rd International Symposium on acid-base interactions: relevance to the adhesion, Newark, June 13-15, 2001.

    6. G.Gottardi, M.Anderle, R.Canteri, E.Carli, M.Grossello, A.Lui, D.Maniglio, L.Pasquardini, C.Pederzolli, C.Della Volpe, S.Siboni and G.Speranza; “Adhesion of staphylococcus epidermidis to polymer surfaces”; CIRMIB-AIMAT National Meeting “2001 Biomaterial Days”, Ischia Porto (I), July 20-21, 2001.

    7. T.Toccoli, M.Anderle, A.Boschetti, C.Corradi, L.Guerini, M.Mazzola, P.Siciliano, and S.Iannotta; “Growth of organic and metal oxide films for gas and VOC Sensing applications by seeded supersonic beams”, International Workshop “Materials and Technologies for Chemical Sensors – MATCHEMS”, Brescia (I), September 13-14, 2001.

    8. M.Anderle and C.Bellachioma, C.Benvenuti, E.Broilo, S.Calatroni, P.Chiggiato, S.Clair, S.Elliot, J.Kenny and W.Vollenberg; “UHV Compatibility of Organic Materials”; IUVSTA 15th International Vacuum Congress and AVS 48th International Symposium, S.Francisco (USA), October 28-November 2, 2001

    9. G.Speranza, R.Canteri, C.Pederzolli, G.Gottardi, L.Pasquardini, E.Carli, M.Grossello, A.Lui and M.Anderle; “Do the chemical properties of polymer surfaces influence the bacterial adhesion?”; IUVSTA 15th International Vacuum Congress and AVS 48th International Symposium, S.Francisco (USA), October 28-November 2, 2001

    10. P.Lazzeri, G.Clauser, A.Lui, E.Iacob, G.Tonidandel and M.Anderle; “Tof-Sims and XPS Characterization of urban aerosols for pollution studies”; 13th International Conference on Secondary Ion Mass Spectrometry and related topics, SIMS XIII, Nara, Japan, November 11-16, 2001.

    11. M.Bersani, D.Giubertoni, M.Barozzi, E.Iacob, L.Vanzetti, M.Anderle, P.Lazzeri, B.Crivelli, and F.Zanderigo; “D-Sims and TOF-SIMS quantitative depth profiles on ultra thin oxinitrides”; 13th International Conference on Secondary Ion Mass Spectrometry and related topics, SIMS XIII, Nara, Japan, November 11-16, 2001.

    12. N.Laidani, L.Calliari, G.Speranza, V.Micheli and M.Anderle; “Synthesis of amorphous/polymeric superlattice carbon film and control of layer structure and stress”; E-MRS-Spring Meeting 2002, Symposium Q, Strasbourg (F), June 18-21, 2002.

    13. M.Bersani, P.Lazzeri, D.Giubertoni, M.Barozzi, E.Boscolo Marchi and M.Anderle; “Arsenic shallow implant characterization by magnetic sector and time of flight SIMS instruments”; Ion Implantation Technology Conference; Taos (NM) USA, September 23-27, 2002.
    14. E.Iacob, M.Bersani, A.Lui, L.Vanzetti, D.Giubertoni, M.Barozzi, and M.Anderle; “Sample topography developed by sputtering in Cameca instruments”; AVS 49th International Symposium; Denver (CO) USA, November 4-8, 2002.

    15. R.Canteri, G.Speranza, M.Anderle; S.Turri, S.Radice; “Surface Characterization of Fluorinated Polyether Ionomers from Aqueos Dispersions”; AVS 49th International Symposium; Denver (CO) USA, November 4-8, 2002.

    16. P.Lazzeri, L.Vanzetti, M.Bersani, M.Anderle; J.J.Park, Z.Lin, G.Y.Yang, R.M.Briger, G.W.Rubloff; “Materials transformation and kinetics in the formation of porous low-K polymer dielectrics for advanced interconnect technology”; AVS 49th International Symposium; Denver (CO) USA, November 4-8, 2002.

    17. L.Vanzetti, E.Iacob, M.Barozzi, D.Giubertoni, M.Bersani, M.Anderle; P.Bacciaglia, B.Crivelli, M.L.Polignano, M.E. Vitali; “Nitride Silicon-Silicon Dioxide Interface: Electrical and Phisico-Chemical Characterization by Complementary Surface Techniques”; AVS 49th International Symposium; Denver (CO) USA, November 4-8, 2002.

    18. P. Lazzeri, L. Vanzetti, E. Iacob, M. Bersani, M. Anderle, J.J. Park, Z. Lin R.M. Briber, G.W. Rubloff, R.D. Miller,“Material characterization and the formation of nanoporous PMSSQ low-k dielectrics”; Characterization and Metrology for ULSI Technology: 2003 International Conference, Austin (TX) USA, March 24-28, 2003.

    19. M. Bersani, D. Giubertoni, M. Barozzi, S. Bertoldi, L. Vanzetti, E. Iacob and M.Anderle, “In situ sputtering rate measurement by laser interferometer applied to SIMS analyses”; Characterization and Metrology for ULSI Technology: 2003 International Conference, Austin (TX) USA, March 24-28, 2003.

    20. D.Giubertoni, M.Barozzi, E. Boscolo, M.Anderle, and M.Bersani, “Boron ultra shallow SIMS profiles optimization using oblique incidente oxygen beam”; Ultra Shallow Junctions Conference, Santa Cruz, (CA) USA, April 30, 2003.