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    Mariano Anderle publications on journals with international referee board

     

     

    Papers 1-20 21-40 41-60 61-80 81-100 101-120 121-140

     

    1. “Human plasma protein absorption on carbon-based materials”, M. Vinante, G. Digregorio, L. Lunelli, S. Forti, S. Musso, L. Vanzetti, A. Lui, L. Pasquardini, M. Giorcelli, A. Tagliaferro, M. Anderle, and C. Pederzolli, in press J. of Nanoscience and Nanotechnology (2008).

     

    1. “Optical absorption parameters of amorphous carbon films from Farouhi-Bloomer and Tanc-Lorenz models: a comparative study”, N. Laidani, R. Bartali, G. Gottardi, M. Anderle and P. Cheyssac, Journal of Phisics: Condensed Matter 20, 015216 (2008).

     

    1. "Immobilization of cationic rifampicin-loaded liposomes on polystyrene for drug-delivery applications”, L.Pasquardini, L. Lunelli, L. Vanzetti, M. Anderle and C. Pederzolli, Colloids and Surfaces B: Biointerfaces 62, 265 (2008).

     

    1. “Multilayer silicon rich oxy-nitride films characterization by SIMS, VASE and AFM”, M. Barozzi, L. Vanzetti, E. Iacob, M. Bersani, M. Anderle, G. Pucker, C. Kompocholis, M. Ghulinyan and P. Bellutti, Journal of Phisics: Conference Series, 100, 012016 (2008).

     

    1. “Optical and mechanical characterization of zirconia-carbon nanocomposite film”, N. Laidani, V. Micheli, R. Bartali, G. Gottardi, M. Anderle, Thin Solid Films 516, 1553 (2008).

     

    1. “PECVD of a-C:H films in CH4-CO2 plasma: gas composition and substrate biasing effects on the film structure and growth process” G. Gottardi, N. Laidani, R. Bartali, V. Micheli, M. Anderle, Thin Solid Films 516, 3910 (2008).

     

    1. “Data analysis in combinatorial experiments: applying supervised principal component technique to investigate the relationship between ToF-SIMS spectra and the composition distribution of ternary metallic alloy thin films”, R.Dell’Anna, P.Lazzeri, R.Canteri, C.J.Long, J.Hattrick-Simpers, I. Takeuchi, and M.Anderle, QSAR & Combinatorial Science 27, 133 (2008).

     

    1. “Interactions of photoresist stripping plasmas with nanoporous organo-silicate ultra low dielectric constant dielectrics”, P. Lazzeri, G. S. Oehrlein, G. J. Stueber, R. McGowan, E. Busch, S. Pederzoli, C. Jeynes, M. Bersani and M. Anderle, Thin Solid Films 516, 3697 (2008).

     

    1. “Effects of oxygen concentration in the Ar/O2 plasma on the bulk structure and surface properties of RF reactively sputtered zirconia thin films”, G. Gottardi, N. Laidani, V. Micheli, R. Bartali, M. Anderle, Surface Coatings and Technology 202, 2332 (2008).

     

    1. “The C1s core line in irradiated graphite”, G. Speranza, L. Minati and M. Anderle, Journal of Appl. Phys 102, 3504 (2007).

     

    1. “Assessment of nanocomposite photonic systems with the X-ray photoelectron spectroscopy”, L.Minati, G.Speranza, M.Anderle, M. Ferrari, A.Chiasera and G.C.Righini, Optoelectronics Letters 3, 193 (2007)

     

    1. “Plasma-Surface Interactions of Model Polymers for Advanced Photoresits using C4F8/Ar Discharges and Energetic Ion Beams”, S.Engelmann, R.L.Bruce, T.Kwon, R.Phaneuf, G.S.Oehrlein, Y.C.Bae, C.Andes, D.Graves, D.Nest, E.A.Hudson, P.Lazzeri, E.Iacob and M.Anderle, J. Vac. Sci. Technol. B25, 1353 (2007).

     

    1. “Purification of carbon nanotubes grown by thermal-CVD”, S.Porro, S.Musso, M.Vinante, L.Vanzetti, M.Anderle, F.Trotta, A.Tagliaferro, Physica E 37, 58 (2007).

     

    1. “Analytical methodology development for silicon-rich-oxide chemical and physical characterization”, M. Barozzi, E. Iacob, L. Vanzetti, M. Bersani, M. Anderle, G. Pucker and C. Kompocholis, Rev. Adv.Mater. Sci. 15, 56 (2007).

     

    1. “Interface effects in hard-soft carbon multilayered films” V. Micheli, N. Laidani, R. Bartali, G. Gottardi and M. Anderle, Plasma Processing and Polymers 4, S259 (2007).

     

    1. “On the photoresist stripping and damage of ultralow k dielectric materials using remote H2- and D2-based discharges”, P. Lazzeri, M . Bersani, M. Anderle, G. J. Stueber, G. S. Oehrlein, E. Bush, and R. McGowan, J. Vac. Sci. Technol. B25, 1593 (2007).

     

    1. “Real-time Sensing and Metrology for Atomic Layer Deposition Processes and Manufacturing”, L.Henn-Lecordier, W. Lei, M.Anderle and G.W. Rubloff,, J. Vac. Sci. Technol. B25, 130 (2007).

     

    1. “Time of flight secondary ion mass spectroscopy investigation of ultralow-k dielectric modifications in hydrogen and deuterium plasmas”, P. Lazzeri, G. J. Stueber, G. S. Oehrlein, R. McGowan, E. Bush, S. Pederzoli, M . Bersani and M. Anderle, J. Vac. Sci. Technol. B24, 2695 (2006).

     

    1. “Materials modeling for photonic applications”, G. Speranza, L. Minati and M. Anderle, Optical Materials 28, 1258 (2006).

     

    1. “Covalent interaction and semiempirical modeling of small molecules”, G. Speranza, L. Minati, and M. Anderle, J.Phys.Chem. A110, 13857 (2006).