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    Mariano Anderle publications on journals with international referee board

     

     

    Papers 1-20 21-40 41-60 61-80 81-100 101-120 121-140

      

    1. “Tof-Sims and XPS Characterization of urban aerosols for pollution studies”; P.Lazzeri, G.Clauser, A.Lui, E.Iacob, G.Tonidandel and M.Anderle; Applied Surface Science 203-204, 767 (2003).

     

    1. “Recent theoretical and experimental advancements in the application of Good-van Oss acid-base theory in the analysis of polymer surfaces. (II) Some peculiar cases”, C.Della Volpe, S.Siboni, D.Maniglio, M.Morra, C.Cassinelli, M.Anderle, G.Speranza, R.Canteri, C.Pederzolli, G.Gottardi, S.Janikowska, A.Lui, Journal of Adhesion Science and Technology, 17, 1425 (2003).

     

    1. "Growth of titanium dioxide films by Cluster Supersonic Beams for VOC Sensing Application", T.Toccoli, S.Capone, L.Guerini, M.Anderle, A.Boschetti, E.Iacob, V.Micheli, P.Siciliano and S.Iannotta, Sensors Journal, IEEE 3(2), 199 (2003)

     

    1. "Mechanical and tribological properties of CNx films deposited by reactive pulsed laser ablation", A.Zocco, A.Perrone, E.Broitman, Zs.Czigany, L.Hultman, M.Anderle, N.Laidani, Diamond and related Materials 11, 98 (2002).

     

    1. "Dependence of the transient enhancement diffusion of B in Si on B concentration and ion implanted dose", S.Solmi, G.Mannino, M.Servidori, M.Bersani, L.Mancini, S.Milita, V.Privitera and M.Anderle, Solid State Phenomena 82-84, 177 (2002).

     

    1. “Observation of photodiode and electroluminescence effects for a-C/a-C:H multilayer nanostructures on silicon”, A.M.Baranov, A.E.Varfolomeev, A.A.Nefedov, L.Calliari, G.Speranza N.Laidani and M.Anderle, Diamond and Related Materials 10, 1040 (2001).

     

    1. “Study of discharge gas trapping during thin film growth", S.Amorosi, M.Anderle, C.Benvenuti, S.Calatroni, J.Carver, P.Chiggiato, H.Neupert and W.Vollenberg, Vacuum 60, 89 (2001).

     

    1. "Carbon effect on the phase structure and the hardness of r.f. sputtered zirconia films", N.Laidani, V.Micheli and M.Anderle, Thin Solid Films 382, 23 (2001).

     

    1. "Semi-quantitative description of C hybridization via s- and p-partial density of states probing: an electron spectroscopy study", G.Speranza, L.Calliari, N.Laidani, and M.Anderle, Diamond and Related Materials 9, 1856 (2000).

     

    1. "Surface study of perfluoropolyether-urethane cross-linked polymers", S.Turri, S.Radice, R.Canteri, G.Speranza and M.Anderle, Surf. Interf. Anal. 29, 873 (2000).

     

    1. “Characterization of perfluoropolyether-urethane coating by Tof-SIMS and XPS", R.Canteri, G.Speranza, M.Anderle, S.Turri, S.Radice and T.Trombetta, Secondary Ion Mass Spectrometry (SIMS XII), Eds A. Benninghoven et al, Elsevier (2000) pg. 741.

     

    1. "XPS and SIMS depth profiling of oxynitrides", L.Vanzetti, M.Bersani, M.Sbetti and M.Anderle, Surf. Interf. Anal. 30, 255 (2000).

     

    1. “Potential role of antibiotic-encapsulated liposomes for the prevention of catheter-related colonization and infections", C.Pederzolli, G.Speranza, R.Canteri, S.Janikowska, E.Carli, A.Lui, P.Gamba, L.Pasquardini, G.Gottardi, R.Antolini and M.Anderle, Proc. of 6th Int. Meeting and Seminar on Ceramics, Cells and Tissue: Drugs Delivery Systems, Faenza (I), Editors A.Ravaglioli and A.Krajewski (2000), pg. 155.

     

    1. “Structural and compositional study of B-C-N films produced by laser ablation of B4C targets in N2 atmosphere”, N.Laidani, M.Anderle, R.Canteri, L.Elia, A.Luches, M.Martino, V.Micheli and G.Speranza, Appl. Surf. Sci. 157, 135 (2000).

     

    1. “Sub-Kev mass spectrometry analyses on oxynitrided ultrathin films", M.Sbetti, M.Bersani, L.Vanzetti, R.Canteri and M.Anderle, Secondary Ion Mass Spectrometry (SIMS XII), Eds A. Benninghoven et al, Elsevier.(2000) pg. 561.

     

    1. “Development of DLC film technology for electronic application”, A.M.Baranov, A.E.Varfolomeev, A.A.Nefedov, M.Anderle, L.Calliari, G.Speranza and N.Laidani, Diamond and Related Materials 9, 649 (2000).

     

    1. “Furnace and RTP nitridation of ultrathin oxide films by NO and N2O: Sims and Tof Sims Characterization", M.Bersani, L.Vanzetti, M.Sbetti and M.Anderle, Secondary Ion Mass Spectrometry (SIMS XII), Eds A. Benninghoven et al, Elsevier. (2000) pg. 509.

     

    1. "Cubic BN deposition on Si substrates at room temperature by KrF excimer laser ablation of h-BN", S.Acquaviva, G.Leggieri, A.Luches, A.Perrone, A.Zocco, N.Laidani, G.Speranza and M.Anderle, Appl.Phys.A70, 197 (2000).

     

    1. “Chemical structure of films grown by AlN laser ablation: an X-ray photoelectron study", N.Laidani, L.Vanzetti, M.Anderle, A.Basillais, C.Boulmer-Leborgne and J.Perriere, Surf. and Coat. Technol. 122, 242 (1999).

     

    1. "Characterization of RTP Oxynitrides by SIMS and XPS Analyses", M.Bersani, L.Vanzetti, M.Sbetti and M.Anderle, Appl. Surf. Science 144-145, 301 (1999).